| dc.description.abstract | Arndt, Shaun M.; Bendix, David C.; Berg, Michael J.; Biedenbender, Paul T.; Boettcher, David M. Chester, NJ; Bortulin, John P.; Burow, Clint A.; Caauwe, Johann W.; Carter, Douglas M.; Chaleunsouk, Tom; Dazen, Fidel; Degner, Samuel C.; Douglas, James E.; Glende, Andrew J.; Guillaume, Nicholas J.; Gumm, Jeremiah J.; Hacker, Jason C.; Hoogervorst, James R.; Hoogervorst, James R.; Juergens, Gerhardt H.; Kampman, Michael L.; Kassulke, Nathan P.; Kiecker, Matthew J.; Killinger, Michael A.; Korthals, Peter J.; Langebartels, John P.; Learman, Timothy D.; Lor, Neng; Mattek, John P.; Meyer, David J.; Naumann, Brett G.; Peil, Tyler R.; Pfeifer, Mathew R.; Prahl, Steven H.; Scharf, David G.; Schultz, Scott M.; Seifert, Joel C.; Sternberg, Peter D.; Van Kampen, Korey P.; Vanderhoof, Collin J.; Vogel, Joel T.; Wagner, Timothy R.; Welch, Clayton G.; White, Christopher D.; Wigley, Brandon A.; Winkelman, Aaron R.; Wolfe, Ryan C.; Yahnke, Dustin B.; Young, Gary M.; Zimpelmann, Adam E.; Mueller, Aaron T.; Sutton, Nathan O.; Gunderson, Mark D.; Seifert, Michael J.; Valleskey, Martin E.; Yu, Xiaohua (Joshua); Boehringer, Luke J.; Kuckhahn, Paul M.; Lindner, Daniel M.; Bare, Jonathan M.; Berg, John C.; Bergemann, Scott W.; Bode, Adam M.; Bolwerk, Jeffery G.; Burgess, Emile J.; Burk, Paul M.; Casmer, Philip J.; Cortright, Geoffrey C.; Degner, Seth D.; Dolan, Aaron J.; Draper, Kevin L.; Graham, Chadwick L.; Hackmann, Brian P.; Huebner, Philip J.; Janke, Philip E.; Koschnitzke, Christopher E.; Krause, Brad D.; Kuschel, Michael J.; Maglietto, Nicholas C.; Munson, Jonathan L.; Novotny, Michael T.; Quinn, Jonathan D.; Radtke, Benjamin A.; Rathje, Christopher J.; Richards, B. Jason; Rogas, Clint A., Jr.; Scharf, Nathanael R.; Schmidt, David W.; Schroeder, Eric D.; Schroeder, Mark J.; Schupmann, Paul W.; Schutz, Mark E.; Seelow, Nathanael P.; Sievert, Dustin D.; Taylor, Bradley P.; Wilcox, P. James; Zimpelmann, Jonathan G. | en_US |
