| dc.description.abstract | Brauer, Bart A.; Brutlag, Brent S.; Daley, Stephen E.; Duin, Matthew L.; Engel, Craig A.; Gawrisch, Joel J.; Gensmer, John R.; Glende, Thomas A.; Glowicki, Jeremy P.; Habben, Daniel J.; Hacker, Samuel J., III; Hartman, Michael A.; Italiano, Frank J., Jr; Kober, Michael M.; Krueger, Todd M.; Kuske, Matthew D.; Lindemann, Earl E.; Meier, Paul M.; Pagels, Steven J.; Rausch, Todd A.; Sauer, Joel T.; Schmidt, Jeffrey J.; Schoenike, Aaron E.; Schroeder, Jonathan E.; Schroer, Andrew C.; Schultz, Clark R.; Schulz, Jason A.; Schwartz, Matthew E.; Schwartz, Timothy M.; Shevey, Wayne A.; Shilling, David M.; Smith, Timothy J.; Toppe, John F.; Waldschmidt, Paul S.; Bode, Timothy L.; Boggs, John H.; Gabb, Mark D.; Schultz, Donald G.; Schulz, Joel A.; Butler, Heath D.; Heiderich, Daniel F.; Micheel, Jonathan A.; Mueller, Adam R.; Schroeder, Stephen P.; Zietlow, Jonathan P.; Brei, Jamie S.; Doebler, Brian C.; Faught, Arthur L.; Fleischmann, David C.; Goetzinger, Harland H.; Heckendorf, Joel S.; Helwig, Stephen G.; Holtz, Matthew A.; Johnson, Christopher D.; Kesting, Joshua W.; Krenke, Matthew D.; Martin, Joshua C.; Miller, Richard M.; Miller, Scott J.; Myslik, Luke J.; Ritchie, William R.; Rohrback, Mark J.; Scharf, Jonathan E.; Schaser, Kurt R.; Schroeder, Christopher L.; Schulz, Paul T.; Schwartz, Andrew D.; Sheppard, Michael G.; Strey, Johnold J.; Sullivan, Michael P.; Weigand, Michael J.; Werner, James M.; Wilke, Russell A., III; Wong, Gary A. | en_US |
